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- W1897732268 abstract "The research described in this paper began in 1988 and is directed at developing effective computerized scheduling procedures for a semiconductor testing facility. To this end we first give a brief overview of the testing process and management goals. We then discuss the performance of a series of different scheduling techniques for this problem, beginning with local dispatching rules that use very limited information through more complex dispatching procedures incorporating local optimization and look-ahead capabilities, culminating in a series of decomposition procedures that take a global view of the test area while making scheduling decisions. Our computational experiments indicate that exploiting the real-time factory status information available in existing factory automation systems can result in significant improvements in shop performance. We conclude the paper with a summary and a discussion of future research directions." @default.
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- W1897732268 date "2002-11-19" @default.
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- W1897732268 title "Decomposition algorithms for scheduling semiconductor testing facilities" @default.
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- W1897732268 doi "https://doi.org/10.1109/iemt.1995.526115" @default.
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