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- W18989993 abstract "This chapter provides an overview of in-situ application of infrared spectroscopic ellipsometry (IRSE) for the characterization of thin films on Si prepared and modified by use of electrochemical surface treatments. In-situ IRSE investigations of Si surfaces during electrochemical grafting of ultra-thin polymeric layers via Grignard compounds (cathodic process), and polypyrrole and polyaniline (both anodic processes) are presented and discussed in detail. The film growth was monitored by an increase in layer specific vibrational signatures of molecules or monomers present on the surface or in the layer. Additionally, species postformed after electrochemical processing (i.e. after drying) and over-oxidation of the polymeric layer have been identified as well as the incorporation of dopants in the polymeric layer by their specific vibrational modes. The obtained results are discussed in frame of layer thickness, structure, and are compared to calculated IRSE spectra in case of very thin layers of nitrobenzene on Si." @default.
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- W18989993 date "2014-01-01" @default.
- W18989993 modified "2023-10-02" @default.
- W18989993 title "Application of In-situ IR-Ellipsometry in Electrochemistry to Study Ultra-Thin Films" @default.
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- W18989993 doi "https://doi.org/10.1007/978-3-642-40128-2_14" @default.
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