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- W1910363917 abstract "The number of robustly testable paths is very low for typical circuits, hence the delay defect coverage of a robust path fault test set can be very small. Robustly testing path-segments which are not covered by any robustly testable paths can enhance the defect coverage of a path test set, however the existence of such uncovered path-segments in benchmark circuits has not been proven so far. In this paper we experimentally prove the existence of robustly testable path-segments not covered by any robustly testable paths in the ISCAS benchmark circuits. A highly effective delay fault test generator using some novel techniques, has been implemented for this purpose and is also described in the paper." @default.
- W1910363917 created "2016-06-24" @default.
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- W1910363917 date "2002-11-08" @default.
- W1910363917 modified "2023-09-23" @default.
- W1910363917 title "Enhanced delay defect coverage with path-segments" @default.
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- W1910363917 doi "https://doi.org/10.1109/test.2000.894228" @default.
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