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- W1912345675 abstract "Beyond 20nm nodes, bulk FinFET is the mainstream technology; however, new process options can result in significant impacts on intrinsic ESD performance. In this work, we study on vfTLP characteristics of two types of ESD diodes. The corresponding TCAD simulations bring an in-depth understanding on the physical mechanism of these ESD diodes." @default.
- W1912345675 created "2016-06-24" @default.
- W1912345675 creator A5003335165 @default.
- W1912345675 creator A5009879848 @default.
- W1912345675 creator A5013111648 @default.
- W1912345675 creator A5017946540 @default.
- W1912345675 creator A5020367935 @default.
- W1912345675 creator A5040177116 @default.
- W1912345675 creator A5064166800 @default.
- W1912345675 date "2015-09-01" @default.
- W1912345675 modified "2023-10-02" @default.
- W1912345675 title "VFTLP characteristics of ESD protection diodes in advanced bulk FinFET technology" @default.
- W1912345675 cites W2046434968 @default.
- W1912345675 cites W2048402386 @default.
- W1912345675 cites W2053271790 @default.
- W1912345675 cites W2143939726 @default.
- W1912345675 doi "https://doi.org/10.1109/eosesd.2015.7314809" @default.
- W1912345675 hasPublicationYear "2015" @default.
- W1912345675 type Work @default.
- W1912345675 sameAs 1912345675 @default.
- W1912345675 citedByCount "4" @default.
- W1912345675 countsByYear W19123456752015 @default.
- W1912345675 countsByYear W19123456752019 @default.
- W1912345675 countsByYear W19123456752020 @default.
- W1912345675 countsByYear W19123456752021 @default.
- W1912345675 crossrefType "proceedings-article" @default.
- W1912345675 hasAuthorship W1912345675A5003335165 @default.
- W1912345675 hasAuthorship W1912345675A5009879848 @default.
- W1912345675 hasAuthorship W1912345675A5013111648 @default.
- W1912345675 hasAuthorship W1912345675A5017946540 @default.
- W1912345675 hasAuthorship W1912345675A5020367935 @default.
- W1912345675 hasAuthorship W1912345675A5040177116 @default.
- W1912345675 hasAuthorship W1912345675A5064166800 @default.
- W1912345675 hasConcept C119599485 @default.
- W1912345675 hasConcept C127413603 @default.
- W1912345675 hasConcept C165801399 @default.
- W1912345675 hasConcept C192562407 @default.
- W1912345675 hasConcept C205483674 @default.
- W1912345675 hasConcept C24326235 @default.
- W1912345675 hasConcept C49040817 @default.
- W1912345675 hasConcept C61696701 @default.
- W1912345675 hasConcept C78434282 @default.
- W1912345675 hasConceptScore W1912345675C119599485 @default.
- W1912345675 hasConceptScore W1912345675C127413603 @default.
- W1912345675 hasConceptScore W1912345675C165801399 @default.
- W1912345675 hasConceptScore W1912345675C192562407 @default.
- W1912345675 hasConceptScore W1912345675C205483674 @default.
- W1912345675 hasConceptScore W1912345675C24326235 @default.
- W1912345675 hasConceptScore W1912345675C49040817 @default.
- W1912345675 hasConceptScore W1912345675C61696701 @default.
- W1912345675 hasConceptScore W1912345675C78434282 @default.
- W1912345675 hasLocation W19123456751 @default.
- W1912345675 hasOpenAccess W1912345675 @default.
- W1912345675 hasPrimaryLocation W19123456751 @default.
- W1912345675 hasRelatedWork W1557559611 @default.
- W1912345675 hasRelatedWork W2053610839 @default.
- W1912345675 hasRelatedWork W2058676402 @default.
- W1912345675 hasRelatedWork W2104118485 @default.
- W1912345675 hasRelatedWork W2149247631 @default.
- W1912345675 hasRelatedWork W2329285141 @default.
- W1912345675 hasRelatedWork W2546552239 @default.
- W1912345675 hasRelatedWork W2899084033 @default.
- W1912345675 hasRelatedWork W2902546961 @default.
- W1912345675 hasRelatedWork W4313653414 @default.
- W1912345675 isParatext "false" @default.
- W1912345675 isRetracted "false" @default.
- W1912345675 magId "1912345675" @default.
- W1912345675 workType "article" @default.