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• W1922128583 abstract "This paper presents analytical expressions for channel noise, induced gate noise (IGN), and cross-correlation noise in a long-channel junctionless (JL) double-gate MOSFET. The analytical relationships, which have been derived from a coherent charge-based model, are validated with technology computer-aided design simulations, and the figures of merit have been compared with the inversion mode FETs. For a given current, we found that the channel thermal noise is very similar for both architectures, whereas the IGN is slightly decreased in the JL FETs." @default.
• W1922128583 created "2016-06-24" @default.
• W1922128583 creator A5012272878 @default.
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• W1922128583 date "2015-08-01" @default.
• W1922128583 modified "2023-10-03" @default.
• W1922128583 title "Modeling Channel Thermal Noise and Induced Gate Noise in Junctionless FETs" @default.
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• W1922128583 doi "https://doi.org/10.1109/ted.2015.2437954" @default.
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