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• W1931750786 abstract "A detailed investigation of electron emission from a set of chemical vapour deposited (CVD) diamond films is reported using high-resolution PeakForce-controlled tunnelling atomic force microscopy (PF-TUNA). Electron field emission originates preferentially from the grain boundaries in low-conductivity polycrystalline diamond samples, and not from the top of features or sharp edges. Samples with smaller grains and more grain boundaries, such as nanocrystalline diamond, produce a higher emission current over a more uniform area than diamond samples with larger grain size. Light doping with N, B or P increases the grain conductivity, with the result that the emitting grain-boundary sites become broader as the emission begins to creep up the grain sidewalls. For heavy B doping, where the grains are now more conducting than the grain boundaries, emission comes from both the grain boundaries and the grains almost equally. Lightly P-doped diamond samples show emission from step-edges on the (1 1 1) surfaces. Emission intensity was time dependent, with the measured current dropping to ∼10% of its initial value ∼30 h after removal from the CVD chamber. This decrease is ascribed to the build-up of adsorbates on the surface along with an increase in the surface conductivity due to surface transfer doping." @default.
• W1931750786 created "2016-06-24" @default.
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• W1931750786 date "2015-11-01" @default.
• W1931750786 modified "2023-10-03" @default.
• W1931750786 title "Direct observation of electron emission from grain boundaries in CVD diamond by PeakForce-controlled tunnelling atomic force microscopy" @default.
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• W1931750786 doi "https://doi.org/10.1016/j.carbon.2015.06.082" @default.
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