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- W1937942879 abstract "Recent studies suggest that it is necessary to generalize the test generation process for path delay faults in order to accommodate various effects that determine the worst-case delay of a path. However, these effects may be too complex to be captured accurately or considered explicitly, especially for large circuits. To alleviate this problem, we propose a test generation approach that generates multiple tests for each path delay fault based on a comprehensive set of conditions under which the worst-case delays are likely to occur. In this way, accurate modeling of delays is not necessary. We describe a specific test generation procedure to demonstrate this approach. The test generation procedure produces, for every target path, two-pattern tests where the first patterns bring every possible combination of values to the off-path inputs. We present experimental results to show the feasibility of a test generation procedure based on this approach." @default.
- W1937942879 created "2016-06-24" @default.
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- W1937942879 date "2002-11-27" @default.
- W1937942879 modified "2023-09-23" @default.
- W1937942879 title "A generalized test generation procedure for path delay faults" @default.
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- W1937942879 doi "https://doi.org/10.1109/ftcs.1998.689478" @default.
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