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- W1939389600 abstract "In the virtual component (VC) integration business, the embedded DRAM is a key VC to realize high bit density and high bandwidth performance, thus the low-cost testing of DRAM-integrated LSI is an emerging problem. The DRAM test usually includes a fail-bit (address) search to repair the memory cell defects with redundancy, requiring long time for wafer probing. A DRAM BIST drastically reduces time of both wafer probing and final test, compared with test by only ATE. In the VC-LSI testing, BIST for embedded DRAM is also required to reduce the test time and to realize VC test isolation." @default.
- W1939389600 created "2016-06-24" @default.
- W1939389600 creator A5000510993 @default.
- W1939389600 date "2002-11-27" @default.
- W1939389600 modified "2023-09-23" @default.
- W1939389600 title "BIST: required for embedded DRAM" @default.
- W1939389600 doi "https://doi.org/10.1109/test.1998.743349" @default.
- W1939389600 hasPublicationYear "2002" @default.
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