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• W1963557645 abstract "A review of the possibility of using noise measurements in analysis and prediction of electron device reliability is given. The noise as an informative parameter for device reliability and its advantages and disadvantages are discussed. A review of qualitative and quantitative noise reliability indicators for diodes, transistors and integrated circuits as well as the methods for failure and defect analysis are presented." @default.
• W1963557645 created "2016-06-24" @default.
• W1963557645 creator A5018713109 @default.
• W1963557645 date "1995-03-01" @default.
• W1963557645 modified "2023-09-27" @default.
• W1963557645 title "Noise as a diagnostic and prediction tool in reliability physics" @default.
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• W1963557645 doi "https://doi.org/10.1016/0026-2714(95)93070-q" @default.
• W1963557645 hasPublicationYear "1995" @default.
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