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- W1965151636 abstract "The structure of the [001]-oriented single crystalline tungsten probes sharpened in ultra-high vacuum using electron beam heating and ion sputtering has been studied using scanning and transmission electron microscopy. The electron microscopy data prove reproducible fabrication of the single-apex tips with nanoscale pyramids grained by the {011} planes at the apexes. These sharp, [001]-oriented tungsten tips have been successfully utilized in high resolution scanning tunneling microscopy imaging of HOPG(0001), SiC(001) and graphene/SiC(001) surfaces. The electron microscopy characterization performed before and after the high resolution STM experiments provides direct correlation between the tip structure and picoscale spatial resolution achieved in the experiments." @default.
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- W1965151636 date "2014-01-17" @default.
- W1965151636 modified "2023-10-01" @default.
- W1965151636 title "Fabrication of [001]-oriented tungsten tips for high resolution scanning tunneling microscopy" @default.
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- W1965151636 doi "https://doi.org/10.1038/srep03742" @default.
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