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• W1966066160 abstract "Abstract This paper reports the observation of defect-related anomalous low temperature drain current–voltage characteristics in AlGaN/GaN modulation-doped field effect transistor (MODFETs). The study compares devices that have a relatively large number of lattice defects, generally referred to as nanopipes or nanotubes, in the vicinity of their active area to defect free devices. At low temperatures (T K ), the measured Ids–Vds characteristics of the devices with defects exhibit anomalous “kinks”. Such anomalous behaviour is not found in defect free devices even at low temperatures. We attribute the observed behaviour to trapping and thermally activated detrapping of charge injected into the AlGaN layer from the 2DEG via real space transfer (RST). The existence of these mechanisms indicates that device self-heating induced channel mobility degradation is not necessarily the sole mechanism for the negative differential resistance at high electric fields in AlGaN/GaN MODFETs." @default.
• W1966066160 created "2016-06-24" @default.
• W1966066160 creator A5003785772 @default.
• W1966066160 creator A5007027098 @default.
• W1966066160 creator A5011558464 @default.
• W1966066160 creator A5041714978 @default.
• W1966066160 creator A5049432916 @default.
• W1966066160 creator A5064497441 @default.
• W1966066160 date "2000-07-01" @default.
• W1966066160 modified "2023-09-27" @default.
• W1966066160 title "Anomalous drain current–voltage characteristics in AlGaN/GaN MODFETs at low temperatures" @default.
• W1966066160 cites W1613547554 @default.
• W1966066160 cites W1969215962 @default.
• W1966066160 cites W1971460701 @default.
• W1966066160 cites W1971742703 @default.
• W1966066160 cites W1988683553 @default.
• W1966066160 cites W2012321469 @default.
• W1966066160 cites W2024380096 @default.
• W1966066160 cites W2024904721 @default.
• W1966066160 cites W2029944797 @default.
• W1966066160 cites W2039956814 @default.
• W1966066160 cites W2089153809 @default.
• W1966066160 cites W2089783345 @default.
• W1966066160 cites W2096074167 @default.
• W1966066160 cites W2111429915 @default.
• W1966066160 cites W2117770796 @default.
• W1966066160 cites W2134767699 @default.
• W1966066160 cites W2138748295 @default.
• W1966066160 cites W2153930382 @default.
• W1966066160 cites W2157202912 @default.
• W1966066160 cites W2333976882 @default.
• W1966066160 cites W2603665248 @default.
• W1966066160 cites W2119290831 @default.
• W1966066160 doi "https://doi.org/10.1016/s0026-2692(00)00026-4" @default.
• W1966066160 hasPublicationYear "2000" @default.
• W1966066160 type Work @default.
• W1966066160 sameAs 1966066160 @default.
• W1966066160 citedByCount "1" @default.
• W1966066160 crossrefType "journal-article" @default.
• W1966066160 hasAuthorship W1966066160A5003785772 @default.
• W1966066160 hasAuthorship W1966066160A5007027098 @default.
• W1966066160 hasAuthorship W1966066160A5011558464 @default.
• W1966066160 hasAuthorship W1966066160A5041714978 @default.
• W1966066160 hasAuthorship W1966066160A5049432916 @default.
• W1966066160 hasAuthorship W1966066160A5064497441 @default.
• W1966066160 hasConcept C103132145 @default.
• W1966066160 hasConcept C119599485 @default.
• W1966066160 hasConcept C121332964 @default.
• W1966066160 hasConcept C127413603 @default.
• W1966066160 hasConcept C145598152 @default.
• W1966066160 hasConcept C147120987 @default.
• W1966066160 hasConcept C148043351 @default.
• W1966066160 hasConcept C165801399 @default.
• W1966066160 hasConcept C172385210 @default.
• W1966066160 hasConcept C18903297 @default.
• W1966066160 hasConcept C192562407 @default.
• W1966066160 hasConcept C26873012 @default.
• W1966066160 hasConcept C2777924906 @default.
• W1966066160 hasConcept C49040817 @default.
• W1966066160 hasConcept C57863236 @default.
• W1966066160 hasConcept C62520636 @default.
• W1966066160 hasConcept C86803240 @default.
• W1966066160 hasConceptScore W1966066160C103132145 @default.
• W1966066160 hasConceptScore W1966066160C119599485 @default.
• W1966066160 hasConceptScore W1966066160C121332964 @default.
• W1966066160 hasConceptScore W1966066160C127413603 @default.
• W1966066160 hasConceptScore W1966066160C145598152 @default.
• W1966066160 hasConceptScore W1966066160C147120987 @default.
• W1966066160 hasConceptScore W1966066160C148043351 @default.
• W1966066160 hasConceptScore W1966066160C165801399 @default.
• W1966066160 hasConceptScore W1966066160C172385210 @default.
• W1966066160 hasConceptScore W1966066160C18903297 @default.
• W1966066160 hasConceptScore W1966066160C192562407 @default.
• W1966066160 hasConceptScore W1966066160C26873012 @default.
• W1966066160 hasConceptScore W1966066160C2777924906 @default.
• W1966066160 hasConceptScore W1966066160C49040817 @default.
• W1966066160 hasConceptScore W1966066160C57863236 @default.
• W1966066160 hasConceptScore W1966066160C62520636 @default.
• W1966066160 hasConceptScore W1966066160C86803240 @default.
• W1966066160 hasLocation W19660661601 @default.
• W1966066160 hasOpenAccess W1966066160 @default.
• W1966066160 hasPrimaryLocation W19660661601 @default.
• W1966066160 hasRelatedWork W1965978145 @default.
• W1966066160 hasRelatedWork W1974304871 @default.
• W1966066160 hasRelatedWork W1979440402 @default.
• W1966066160 hasRelatedWork W1992805907 @default.
• W1966066160 hasRelatedWork W1994500425 @default.
• W1966066160 hasRelatedWork W2010208445 @default.
• W1966066160 hasRelatedWork W2039219095 @default.
• W1966066160 hasRelatedWork W2039647846 @default.
• W1966066160 hasRelatedWork W2042097436 @default.
• W1966066160 hasRelatedWork W2064824443 @default.
• W1966066160 hasRelatedWork W2074177530 @default.
• W1966066160 hasRelatedWork W2074763109 @default.
• W1966066160 hasRelatedWork W2080186092 @default.
• W1966066160 hasRelatedWork W2081233680 @default.
• W1966066160 hasRelatedWork W2081244635 @default.
• W1966066160 hasRelatedWork W2091587651 @default.
• W1966066160 hasRelatedWork W2101017295 @default.
• W1966066160 hasRelatedWork W2105881941 @default.

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