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• W1966154025 abstract "In the recent past structure determination of microporous materials has experienced considerable developments in methodology. The FOCUS method: high resolution powder diffraction data used for direct method structure solution in combination with crystal chemistry based modelling. The models are retrieved from electron density maps calculated in direct method runs, energy minimized and checked through for realistic angles and distances values. The SUM-TF method: diffraction patterns at moderate resolution analysed with direct methods using a modified tangent formula which includes Patterson information for the structure solving. In this way the atomic resolution criterion for direct methods is bypassed. This overview gives a summary of the structures successfully solved using these new techniques." @default.
• W1966154025 created "2016-06-24" @default.
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• W1966154025 date "1998-05-01" @default.
• W1966154025 modified "2023-09-29" @default.
• W1966154025 title "New structures—new insights: Progress in structure analysis of nanoporous materials" @default.
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• W1966154025 doi "https://doi.org/10.1016/s1387-1811(98)00003-1" @default.
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