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- W1966641530 abstract "Silicon-on-insulator (SOI) SRAMs have different characteristics from those fabricated in traditional bulk silicon. Fault models and sensitivities must be considered when testing for SOI manufacturing defects. Circuit details of SOI SRAMs that relate to testing are presented and a new pattern is described which covers the related fault models." @default.
- W1966641530 created "2016-06-24" @default.
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- W1966641530 creator A5032896732 @default.
- W1966641530 date "2002-11-07" @default.
- W1966641530 modified "2023-09-25" @default.
- W1966641530 title "Silicon-on-insulator technology impacts on SRAM testing" @default.
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- W1966641530 doi "https://doi.org/10.1109/vtest.2000.843825" @default.
- W1966641530 hasPublicationYear "2002" @default.
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