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• W1966675879 abstract "In situ straining in nanocrystalline Au thin films reveals a new fracture mechanism, i.e. crack propagation by atomic migration. The crack propagates by repetitively nucleating and moving atomic steps from the tip region to the crack rear. The stress concentration at the tip helps in the step nucleation process. The elastic energy density at the notch root decreases with increasing notch angle, which implies cracks with small angles can propagate along grain boundaries more easily." @default.
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• W1966675879 date "2011-09-01" @default.
• W1966675879 modified "2023-10-16" @default.
• W1966675879 title "In situ TEM study on crack propagation in nanoscale Au thin films" @default.
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• W1966675879 doi "https://doi.org/10.1016/j.scriptamat.2011.05.009" @default.
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