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• W1968490143 abstract "There are many challenges inherent in the design of nano-CMOS. This paper describes our recent work relating to the physical design of CMOS circuits. First, in line with variation-aware design, a novel ingenious method of measuring variations in subthreshold characteristics is described. Next, recent RF CMOS issues and approaches to nano-CMOS are discussed. Finally, an on-chip transmission line interconnect developed for global wiring is discussed." @default.
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• W1968490143 date "2009-01-01" @default.
• W1968490143 modified "2023-10-11" @default.
• W1968490143 title "Physical design challenges to nano-CMOS circuits" @default.
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• W1968490143 doi "https://doi.org/10.1587/elex.6.703" @default.
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