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- W1969796871 abstract "The structural properties of the films were investigated by X-ray diffraction measurements. The morphology of the films was investigated with a scanning electron microscope. The optical reflectance and transmittance measurements were carried out in the wavelength range 0.3-0.8 μm. The Van der Pauw method was used to measure the electrical resistivity" @default.
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- W1969796871 date "1989-09-01" @default.
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- W1969796871 title "Optical properties of ZnO films deposited by r.f. sputtering on sapphire substrates" @default.
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- W1969796871 doi "https://doi.org/10.1016/0040-6090(89)90104-1" @default.
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