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• W1970037203 abstract "In this study, we investigated how controlling lattice-mismatch strain affected the crystal structure as well as the macroscopic and microscopic ferroelectric properties of (001) BiFeO 3 epitaxial thin films. Lattice-mismatch strain was controlled by introducing a BaTiO 3 buffer layer. Structural analysis indicated that the film with a lattice mismatch of − 1.3% has a crystal structure of the rhombohedral-like monoclinic phase (M A ). In contrast, the crystal structure of the film with a lattice mismatch of 0.5% is M A with a (001) plane tilted from the normal of the substrate surface. Scanning probe microscopy with a conducting probe revealed that the density of leakage spots of the film with the lattice mismatch of 0.5% was lower than that of the film with a lattice mismatch of − 1.3%. In addition, the inverse piezoelectric response of the film with the lattice mismatch of 0.5% is about two times larger than that of the film with the lattice mismatch of − 1.3%. We suggest that the domain engineering more strongly affects the tilted M A phase. • The effect of misfit strain on crystal structure and piezoelectric properties of BiFeO 3 films was studied. • The misfit strain was controlled by the introduction of a BaTiO 3 buffer layer. • The crystal structure of the films could be controlled. • The density of leakage spots for the film deceased by decreasing the misfit strain. • The film with low lattice misfit had larger inverse piezoelectric response." @default.
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• W1970037203 date "2014-01-01" @default.
• W1970037203 modified "2023-10-17" @default.
• W1970037203 title "Crystal structure and local piezoelectric properties of strain-controlled (001) BiFeO3 epitaxial thin films" @default.
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• W1970037203 doi "https://doi.org/10.1016/j.tsf.2013.10.178" @default.
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