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• W1971308001 abstract "We report on the application of defect-enhanced silicon waveguide photodiodes operating at 1550 nm as power monitors for use in photonic integrated circuits. In-line monitors of 250-μm length provide an efficiency of 97 mA/W by absorbing only 8% of the optical mode. The monitors were integrated onto micro-ring waveguide ports to provide measures of optical resonance characteristics and a feedback to a thermal resonance tuner. The suitability of these photodetectors for control of micro-ring resonators is demonstrated." @default.
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• W1971308001 date "2012-02-01" @default.
• W1971308001 modified "2023-09-27" @default.
• W1971308001 title "Monitoring and Tuning Micro-Ring Properties Using Defect-Enhanced Silicon Photodiodes at 1550 nm" @default.
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• W1971308001 doi "https://doi.org/10.1109/lpt.2011.2177453" @default.
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