Matches in SemOpenAlex for { <https://semopenalex.org/work/W1971445636> ?p ?o ?g. }
- W1971445636 abstract "Large (>102) and stable resistance switching characteristics were demonstrated in TiN/SiO2/Fe structure due to the presence of a thin FeOx transition layer at the SiO2/Fe interface, produced spontaneously during the plasma-enhanced tetraethyl orthosilicate oxide deposition process. Addition of Pt into Fe electrode, i.e., a TiN/SiO2/Fe0.73Pt0.27 structure, was observed to improve the data dispersion of switching parameters, associating with the decrease in Fe content inside the FeOx layer. Additionally, current-voltage fitting data shows that current transport mechanism is governed by Ohm’s law in low voltage region and Pool–Frenkel behavior in high voltage region, consisting with FeOx phase transition characteristics." @default.
- W1971445636 created "2016-06-24" @default.
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- W1971445636 date "2010-02-01" @default.
- W1971445636 modified "2023-10-18" @default.
- W1971445636 title "A study of resistive switching effects on a thin FeOx transition layer produced at the oxide/iron interface of TiN/SiO2/Fe-contented electrode structures" @default.
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- W1971445636 doi "https://doi.org/10.1063/1.3294632" @default.
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