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- W1971596937 abstract "An extensive review is given of the results from literature on electron beam induced deposition. Electron beam induced deposition is a complex process, where many and often mutually dependent factors are involved. The process has been studied by many over many years in many different experimental setups, so it is not surprising that there is a great variety of experimental results. To come to a better understanding of the process, it is important to see to which extent the experimental results are consistent with each other and with the existing model. All results from literature were categorized by sorting the data according to the specific parameter that was varied (current density, acceleration voltage, scan patterns, etc.). Each of these parameters can have an effect on the final deposit properties, such as the physical dimensions, the composition, the morphology, or the conductivity. For each parameter-property combination, the available data are discussed and (as far as possible) interpreted. By combining models for electron scattering in a solid, two different growth regimes, and electron beam induced heating, the majority of the experimental results were explained qualitatively. This indicates that the physical processes are well understood, although quantitatively speaking the models can still be improved. The review makes clear that several major issues remain. One issue encountered when interpreting results from literature is the lack of data. Often, important parameters (such as the local precursor pressure) are not reported, which can complicate interpretation of the results. Another issue is the fact that the cross section for electron induced dissociation is unknown. In a number of cases, a correlation between the vertical growth rate and the secondary electron yield was found, which suggests that the secondary electrons dominate the dissociation rather than the primary electrons. Conclusive evidence for this hypothesis has not been found. Finally, there is a limited understanding of the mechanism of electron induced precursor dissociation. In many cases, the deposit composition is not directly dependent on the stoichiometric composition of the precursor and the electron induced decomposition paths can be very different from those expected from calculations or thermal decomposition. The dissociation mechanism is one of the key factors determining the purity of the deposits and a better understanding of this process will help develop electron beam induced deposition into a viable nanofabrication technique." @default.
- W1971596937 created "2016-06-24" @default.
- W1971596937 creator A5041766919 @default.
- W1971596937 creator A5085129447 @default.
- W1971596937 date "2008-10-15" @default.
- W1971596937 modified "2023-10-01" @default.
- W1971596937 title "A critical literature review of focused electron beam induced deposition" @default.
- W1971596937 cites W1537992185 @default.
- W1971596937 cites W1669287089 @default.
- W1971596937 cites W1817495804 @default.
- W1971596937 cites W1964737351 @default.
- W1971596937 cites W1964894592 @default.
- W1971596937 cites W1965531492 @default.
- W1971596937 cites W1966831137 @default.
- W1971596937 cites W1967710304 @default.
- W1971596937 cites W1968581270 @default.
- W1971596937 cites W1968634812 @default.
- W1971596937 cites W1968700433 @default.
- W1971596937 cites W1968817892 @default.
- W1971596937 cites W1968921327 @default.
- W1971596937 cites W1969055711 @default.
- W1971596937 cites W1970431991 @default.
- W1971596937 cites W1971911271 @default.
- W1971596937 cites W1973321071 @default.
- W1971596937 cites W1974736562 @default.
- W1971596937 cites W1974959996 @default.
- W1971596937 cites W1979446917 @default.
- W1971596937 cites W1979552923 @default.
- W1971596937 cites W1984585318 @default.
- W1971596937 cites W1985175951 @default.
- W1971596937 cites W1985597659 @default.
- W1971596937 cites W1987726060 @default.
- W1971596937 cites W1987892159 @default.
- W1971596937 cites W1988239752 @default.
- W1971596937 cites W1989536182 @default.
- W1971596937 cites W1991075458 @default.
- W1971596937 cites W1992616204 @default.
- W1971596937 cites W1992687266 @default.
- W1971596937 cites W1993806407 @default.
- W1971596937 cites W1994365941 @default.
- W1971596937 cites W1994674287 @default.
- W1971596937 cites W1994727392 @default.
- W1971596937 cites W1996486115 @default.
- W1971596937 cites W1997407647 @default.
- W1971596937 cites W1997804745 @default.
- W1971596937 cites W1998443898 @default.
- W1971596937 cites W2000568020 @default.
- W1971596937 cites W2001067876 @default.
- W1971596937 cites W2001290920 @default.
- W1971596937 cites W2002210818 @default.
- W1971596937 cites W2004115183 @default.
- W1971596937 cites W2005562024 @default.
- W1971596937 cites W2008296467 @default.
- W1971596937 cites W2010009348 @default.
- W1971596937 cites W2012623704 @default.
- W1971596937 cites W2012933113 @default.
- W1971596937 cites W2013400099 @default.
- W1971596937 cites W2014932562 @default.
- W1971596937 cites W2017007572 @default.
- W1971596937 cites W2017872620 @default.
- W1971596937 cites W2018460065 @default.
- W1971596937 cites W2018871609 @default.
- W1971596937 cites W2020845563 @default.
- W1971596937 cites W2023510780 @default.
- W1971596937 cites W2023689651 @default.
- W1971596937 cites W2024334486 @default.
- W1971596937 cites W2024853244 @default.
- W1971596937 cites W2025090317 @default.
- W1971596937 cites W2025169268 @default.
- W1971596937 cites W2026858683 @default.
- W1971596937 cites W2026893483 @default.
- W1971596937 cites W2029026207 @default.
- W1971596937 cites W2029225945 @default.
- W1971596937 cites W2029849663 @default.
- W1971596937 cites W2030014577 @default.
- W1971596937 cites W2030153869 @default.
- W1971596937 cites W2031146285 @default.
- W1971596937 cites W2032111563 @default.
- W1971596937 cites W2036582552 @default.
- W1971596937 cites W2037576635 @default.
- W1971596937 cites W2038059295 @default.
- W1971596937 cites W2038315436 @default.
- W1971596937 cites W2038391633 @default.
- W1971596937 cites W2039251174 @default.
- W1971596937 cites W2040531580 @default.
- W1971596937 cites W2041930420 @default.
- W1971596937 cites W2044183789 @default.
- W1971596937 cites W2044532255 @default.
- W1971596937 cites W2045147839 @default.
- W1971596937 cites W2046015144 @default.
- W1971596937 cites W2046532581 @default.
- W1971596937 cites W2046941683 @default.
- W1971596937 cites W2047387194 @default.
- W1971596937 cites W2047654209 @default.
- W1971596937 cites W2047961949 @default.
- W1971596937 cites W2048120151 @default.
- W1971596937 cites W2050618589 @default.
- W1971596937 cites W2052383696 @default.
- W1971596937 cites W2052778580 @default.
- W1971596937 cites W2053331757 @default.