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- W1971895594 abstract "Research Article| January 01, 2002 Beryllium Analyses by Secondary Ion Mass Spectrometry Richard L. Hervig Richard L. Hervig Center for Solid State Science Arizona State University Tempe, Arizona 85287, richard.hervig@asu.edu Search for other works by this author on: GSW Google Scholar Reviews in Mineralogy and Geochemistry (2002) 50 (1): 319–332. https://doi.org/10.2138/rmg.2002.50.8 Article history first online: 14 Jul 2017 Cite View This Citation Add to Citation Manager Share Icon Share Facebook Twitter LinkedIn MailTo Tools Icon Tools Get Permissions Search Site Citation Richard L. Hervig; Beryllium Analyses by Secondary Ion Mass Spectrometry. Reviews in Mineralogy and Geochemistry 2002;; 50 (1): 319–332. doi: https://doi.org/10.2138/rmg.2002.50.8 Download citation file: Ris (Zotero) Refmanager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentBy SocietyReviews in Mineralogy and Geochemistry Search Advanced Search Secondary ion mass spectrometry (SIMS, or ion microprobe) represents an extremely sensitive technique for the microanalysis of beryllium. Positive ions of beryllium are readily formed and its analysis by SIMS is not overly complicated. Matrix effects appear to be small (<20%). In this chapter I will describe SIMS instrumentation, the problems facing Be analysis, solutions to these problems, calibrations for Be and limits of detection. As of the writing of this chapter (mid-2000), SIMS instruments broadly useful to geochemists are commercially available from two companies. Australian Scientific Instruments (ASI, at www.anutech.com.au/asi/shrimpii.htm) sells the SHRIMP (Super High Resolution Ion Micro... You do not have access to this content, please speak to your institutional administrator if you feel you should have access." @default.
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- W1971895594 title "Beryllium Analyses by Secondary Ion Mass Spectrometry" @default.
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