FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W1972211000> ?p ?o ?g. }

• W1972211000 endingPage "1982" @default.
• W1972211000 startingPage "1967" @default.
• W1972211000 abstract "An inversion of the x-ray photoelectron diffraction (XPD) experiment has been performed in which incident electrons are diffracted to reach different sites within a crystal with differing relative probabilities reflecting those for escape of photoelectrons from the same sites in the corresponding XPD experiment. The diffracted-electron flux arriving at each site was monitored by using a Si(Li) detector to measure the intensity of the characteristic x-ray emission following core ionization by the incident electrons. This new technique, termed `inverted' x-ray photoelectron diffraction (iXPD), has been initially applied to Si(100) for rotation about , and the expected close parallels between XPD and iXPD data have been observed. Although the intensity of the x-ray signal increased rapidly as the incident-beam energy was increased beyond the threshold value for core ionization, the extent of the angular anisotropy correspondingly decreased, and there was little advantage in terms of signal:noise ratio in the iXPD pattern in increasing the energy to more than 10 - 15 eV above the threshold. The reduction in anisotropy resulted from a progressive degradation of the directional integrity of the electron beam by inelastic energy-loss processes. The angular resolution in iXPD is governed by the incident-beam divergence, which can easily be as small as , much less than the angular acceptance of typical electron energy analysers. High-resolution iXPD data taken above the threshold showed up to 38% angular anisotropy, much more than for conventional XPD at angular resolution, while iXPD data taken as much as 15 - 30 eV above the threshold still revealed splittings of all of the principal forward-scattering maxima of . Similar splittings have been reported for high-resolution XPD of other systems, but not for Si(100). Their origins are briefly discussed." @default.
• W1972211000 created "2016-06-24" @default.
• W1972211000 creator A5077740483 @default.
• W1972211000 date "1997-03-03" @default.
• W1972211000 modified "2023-10-17" @default.
• W1972211000 title "High-resolution inverted x-ray photoelectron diffraction studies of Si(100)" @default.
• W1972211000 cites W1967747404 @default.
• W1972211000 cites W1971526131 @default.
• W1972211000 cites W1976105903 @default.
• W1972211000 cites W1977040517 @default.
• W1972211000 cites W1978610069 @default.
• W1972211000 cites W1979290102 @default.
• W1972211000 cites W1983396120 @default.
• W1972211000 cites W1985306662 @default.
• W1972211000 cites W1988939554 @default.
• W1972211000 cites W1989781322 @default.
• W1972211000 cites W1998798486 @default.
• W1972211000 cites W1999413435 @default.
• W1972211000 cites W2014789013 @default.
• W1972211000 cites W2015956173 @default.
• W1972211000 cites W2016433482 @default.
• W1972211000 cites W2023644938 @default.
• W1972211000 cites W2028677910 @default.
• W1972211000 cites W2028891971 @default.
• W1972211000 cites W2031805852 @default.
• W1972211000 cites W2034720238 @default.
• W1972211000 cites W2036937934 @default.
• W1972211000 cites W2044629458 @default.
• W1972211000 cites W2048039664 @default.
• W1972211000 cites W2050006571 @default.
• W1972211000 cites W2057570764 @default.
• W1972211000 cites W2063546049 @default.
• W1972211000 cites W2070642095 @default.
• W1972211000 cites W2086892195 @default.
• W1972211000 cites W2090018033 @default.
• W1972211000 cites W2095478125 @default.
• W1972211000 cites W2108419511 @default.
• W1972211000 cites W2135313593 @default.
• W1972211000 cites W2138313255 @default.
• W1972211000 cites W2146982919 @default.
• W1972211000 cites W2163007380 @default.
• W1972211000 doi "https://doi.org/10.1088/0953-8984/9/9/011" @default.
• W1972211000 hasPublicationYear "1997" @default.
• W1972211000 type Work @default.
• W1972211000 sameAs 1972211000 @default.
• W1972211000 citedByCount "3" @default.
• W1972211000 countsByYear W19722110002018 @default.
• W1972211000 crossrefType "journal-article" @default.
• W1972211000 hasAuthorship W1972211000A5077740483 @default.
• W1972211000 hasConcept C114614502 @default.
• W1972211000 hasConcept C120665830 @default.
• W1972211000 hasConcept C121332964 @default.
• W1972211000 hasConcept C133848361 @default.
• W1972211000 hasConcept C145148216 @default.
• W1972211000 hasConcept C147120987 @default.
• W1972211000 hasConcept C184779094 @default.
• W1972211000 hasConcept C185544564 @default.
• W1972211000 hasConcept C198291218 @default.
• W1972211000 hasConcept C207114421 @default.
• W1972211000 hasConcept C33923547 @default.
• W1972211000 hasConcept C62520636 @default.
• W1972211000 hasConcept C71570822 @default.
• W1972211000 hasConcept C77557913 @default.
• W1972211000 hasConcept C85725439 @default.
• W1972211000 hasConceptScore W1972211000C114614502 @default.
• W1972211000 hasConceptScore W1972211000C120665830 @default.
• W1972211000 hasConceptScore W1972211000C121332964 @default.
• W1972211000 hasConceptScore W1972211000C133848361 @default.
• W1972211000 hasConceptScore W1972211000C145148216 @default.
• W1972211000 hasConceptScore W1972211000C147120987 @default.
• W1972211000 hasConceptScore W1972211000C184779094 @default.
• W1972211000 hasConceptScore W1972211000C185544564 @default.
• W1972211000 hasConceptScore W1972211000C198291218 @default.
• W1972211000 hasConceptScore W1972211000C207114421 @default.
• W1972211000 hasConceptScore W1972211000C33923547 @default.
• W1972211000 hasConceptScore W1972211000C62520636 @default.
• W1972211000 hasConceptScore W1972211000C71570822 @default.
• W1972211000 hasConceptScore W1972211000C77557913 @default.
• W1972211000 hasConceptScore W1972211000C85725439 @default.
• W1972211000 hasIssue "9" @default.
• W1972211000 hasLocation W19722110001 @default.
• W1972211000 hasOpenAccess W1972211000 @default.
• W1972211000 hasPrimaryLocation W19722110001 @default.
• W1972211000 hasRelatedWork W1982285080 @default.
• W1972211000 hasRelatedWork W1994035093 @default.
• W1972211000 hasRelatedWork W1994297355 @default.
• W1972211000 hasRelatedWork W2019382718 @default.
• W1972211000 hasRelatedWork W2032138137 @default.
• W1972211000 hasRelatedWork W2045567821 @default.
• W1972211000 hasRelatedWork W2075468742 @default.
• W1972211000 hasRelatedWork W2093181719 @default.
• W1972211000 hasRelatedWork W3206662807 @default.
• W1972211000 hasRelatedWork W4327856537 @default.
• W1972211000 hasVolume "9" @default.
• W1972211000 isParatext "false" @default.
• W1972211000 isRetracted "false" @default.
• W1972211000 magId "1972211000" @default.
• W1972211000 workType "article" @default.