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• W1972510079 abstract "Electron scattering lengths, or escape depths, have been compiled from the literature for twenty different materials in the energy range 0–3000 eV. The energy dependence of the escape depth and its implications for interpretation of photoemission and Auger-electron data are discussed." @default.
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• W1972510079 date "1974-01-01" @default.
• W1972510079 modified "2023-10-10" @default.
• W1972510079 title "The probing depth in photoemission and auger-electron spectroscopy" @default.
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• W1972510079 doi "https://doi.org/10.1016/0368-2048(74)80024-1" @default.
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