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• W1972748239 abstract "Polycrystalline CoPtCr/CrV (or Cr) thin films with different Cr concentrations were prepared by sputter deposition on NiP-plated Al substrates. TEM images revealed the existence of bicrystal clusters. High field torque measurement was used to determine the intrinsic anisotropy constant. The M-H loop and torque hysteresis measurement coupled with micromagnetic modeling permitted determination of intergranular interactions. The cross-track correlation length was evaluated from micromagnetic noise calculation and compared well with the result from measured noise spectra. The physical implication of a bicrystal structure is discussed in general." @default.
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• W1972748239 date "1995-01-01" @default.
• W1972748239 modified "2023-10-16" @default.
• W1972748239 title "Micromagnetic and experimental studies of CoPtCr polycrystalline thin film media with bicrystal microstructure" @default.
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• W1972748239 doi "https://doi.org/10.1109/20.490163" @default.
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