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• W1973019519 abstract "The microstructure of YBa2Cu3O7−δ thin films deposited on (001)LaAlO3 substrates by a laser ablation process has been investigated by scanning electron microscopy, x-ray diffraction, and cross-sectional transmission electron microscopy. Adjacent to the substrate, the film is entirely oriented with the c-axis perpendicular to the surface. At a thickness of about 0.4 μm, the occurrence of 90° boundaries brings about a transition to grains with their c-axes parallel to the surface (aligned along the [100] and [010] directions of the pseudocubic LaAlO3 substrate). This transition is discussed in terms of the crystal growth anisotropy and the retained strain that may precipitate the transition." @default.
• W1973019519 created "2016-06-24" @default.
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• W1973019519 date "1991-02-25" @default.
• W1973019519 modified "2023-09-23" @default.
• W1973019519 title "Dependence of crystalline orientation on film thickness in laser-ablated YBa2Cu3O7−δ on LaAlO3" @default.
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• W1973019519 doi "https://doi.org/10.1063/1.104491" @default.
• W1973019519 hasPublicationYear "1991" @default.
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