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- W1973401426 abstract "Abstract The atomic force microscope (AFM) has been used to investigate the morphological development and the local polarization under a bias voltage of the P(VDF/TrFE) copolymer. “Piezoresponse” and topography images were recorded using the contact mode. Ultra-thin films were used to successfully write memory bits via the local polarization induced by the electric field imposed by the Scanning Probe Microscopy tip between the gold-coated cantilever and the conductive substrate. This technqiue allows the simultaneous and direct observation of both the local ferroelectric polarity and the domain structure (surface topography). These results show the possibility of high data storage in such copolymer films." @default.
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- W1973401426 date "2001-02-01" @default.
- W1973401426 modified "2023-09-27" @default.
- W1973401426 title "The use of nanotechnology to fabricate ultra-high density molecular memory in P(VDF/TRFE) copolymer: data storage" @default.
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- W1973401426 doi "https://doi.org/10.1016/s0151-9107(01)90038-8" @default.
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