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• W1973592306 abstract "This paper presents a complete radio frequency identification (RFID) test platform to characterize the nonlinear effects produced by passive ultra-high frequency (UHF) RFID chips. In full operation mode, automated measurements of activation power, harmonic response level, and impedances are performed in a wide frequency range up to the fourth harmonic. The characterization method, platform composition, and operation are explained through real measurements on UHF Class-1 Generation-2 chips. A harmonic treatment is presented thanks to the joint use of an RFID tester and impedance tuners, and the effect of the antenna-chip impedance matching on the harmonic responses is compared before and after treatment. To the best of our knowledge, no similar platform has been presented in the literature." @default.
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• W1973592306 date "2014-09-01" @default.
• W1973592306 modified "2023-09-26" @default.
• W1973592306 title "RFID Test Platform: Nonlinear Characterization" @default.
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• W1973592306 doi "https://doi.org/10.1109/tim.2014.2307754" @default.
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