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• W1973841123 abstract "A tremendous progress in X-ray optics development was made in the past decade. Progress has been driven by the unique properties of X-ray beams produced by third generation synchrotron sources. The very low emittance coupled with high brilliance allows one to develop efficient focusing devices for new X-ray microscopy techniques. This article provides an overview of the state-of-the-art in micro-focusing optics and methods for hard X-rays. The main emphasis is put on those methods which aim to produce submicron and nanometer resolution. These methods fall into three broad categories: reflective, refractive and diffractive optics. The basic principles and recent achievements are discussed for all optical devices. To cite this article: A. Snigirev, I. Snigireva, C. R. Physique 9 (2008). Pendant la dernière décennie, des progrès énormes ont été accomplis dans le domaine de l'optique des rayons X. Ces progrès découlent des propriétés uniques des faisceaux X produits par les sources synchrotron de troisième génération, dont la faible émittance, couplée à une brillance élevée, permet le développement de dispositifs de focalisation efficaces pour de nouvelles techniques de microscopie X. Cet article donne un aperçu de l'état de l'art des optiques microfocalisantes et des méthodes pour les rayons X durs. L'accent est mis sur les méthodes visant à produire une résolution submicrométrique, voire nanométrique. Ces méthodes se rangent dans trois grandes catégories : réflexion, réfraction et diffraction. Nous présentons les principes de base et des résultats récents pour chaque dispositif optique. Pour citer cet article : A. Snigirev, I. Snigireva, C. R. Physique 9 (2008)." @default.
• W1973841123 created "2016-06-24" @default.
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• W1973841123 date "2008-06-01" @default.
• W1973841123 modified "2023-10-03" @default.
• W1973841123 title "High energy X-ray micro-optics" @default.
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• W1973841123 doi "https://doi.org/10.1016/j.crhy.2008.02.003" @default.
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