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• W1974133057 abstract "We study the effect of monolayer quality on the electrical transport through n-Si/C(n)H(2n+1)/Hg junctions (n = 12, 14, and 18) and find that truly high quality layers and only they, yield the type of data, reported by us in Phys. Rev. Lett. 2005, 95, 266807, data that are consistent with the theoretically predicted behavior of a Schottky barrier coupled to a tunnel barrier. By using that agreement as our starting point, we can assess the effects of changing the quality of the alkyl monolayers, as judged from ellipsometer, contact angle, XPS, and ATR-FTIR measurements, on the electrical transport. Although low monolayer quality layers are easily identified by one or more of those characterization tools, as well as from the current-voltage measurements, even a combination of characterization techniques may not suffice to distinguish between monolayers with minor differences in quality, which, nevertheless, are evident in the transport measurement. The thermionic emission mechanism, which in these systems dominates at low forward bias, is the one that is most sensitive to monolayer quality. It serves thus as the best quality control. This is important because, even where tunneling characteristics appear rather insensitive to slightly diminished quality, their correct analysis will be affected, especially if layers of different lengths are also of different quality." @default.
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• W1974133057 date "2006-07-07" @default.
• W1974133057 modified "2023-10-16" @default.
• W1974133057 title "Importance of Monolayer Quality for Interpreting Current Transport through Organic Molecules: Alkyls on Oxide-Free Si" @default.
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• W1974133057 doi "https://doi.org/10.1021/la060718d" @default.
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