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- W1974255512 abstract "physica status solidi (a)Volume 75, Issue 1 p. 11-48 Review Article Failure physics of integrated circuits and relationship to reliability N. D. Stojadinović, N. D. Stojadinović Faculty of Electronic Engineering, University of Niš Search for more papers by this authorS. D. Ristić, S. D. Ristić Faculty of Electronic Engineering, University of Niš Search for more papers by this author N. D. Stojadinović, N. D. Stojadinović Faculty of Electronic Engineering, University of Niš Search for more papers by this authorS. D. Ristić, S. D. Ristić Faculty of Electronic Engineering, University of Niš Search for more papers by this author First published: 16 January 1983 https://doi.org/10.1002/pssa.2210750102Citations: 5 Beogradska 14, 18000 Niš, Yugoslavia. AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat Citing Literature Volume75, Issue116 January 1983Pages 11-48 RelatedInformation" @default.
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- W1974255512 title "Failure physics of integrated circuits and relationship to reliability" @default.
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