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- W1974287746 abstract "The hardness assurance problem of estimating electrical parameter end points in a combined environment (e.g., neutrons and total ionizing dose) using data in each environment separately is solved. The methodology applies to any other situation where several independent normally distributed variables combine to form a final parameter. The precision deteriorates only when the estimate of end points would be questionable in any event, namely, when very high confidence and probability are required but too few parts were sampled for the environment which is the major source of variation.< <ETX xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>></ETX>" @default.
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- W1974287746 date "1991-12-01" @default.
- W1974287746 modified "2023-09-23" @default.
- W1974287746 title "Estimating parameter end points for combined environments (semiconductor devices)" @default.
- W1974287746 cites W1993078508 @default.
- W1974287746 doi "https://doi.org/10.1109/23.124148" @default.
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