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- W1974448095 abstract "X-ray photoelectron spectroscopy has been used to determine the N/P concentration ratio in the surface region (30–60 A) of the cell wall of various strains of Saccharomyces cerevisiae and carlbergensis cultured under different conditions. An original way of using XPS has also allowed the evaluation of the absolute N and P concentrations, the range of which is found to fit the range reported in the literature for the whole cell wall. Sample degradation is avoided by using short analysis times. The approximate performances of the method of analysis are as follows: reproducibility of N/P concentration ratio, ±20%; reproducibility of absolute concentration, ±40%; extent of the possible systematic error, factor of 2. Despite precision and accuracy limitations, XPS is a valuable tool for investigating the surface properties of cell walls. The implications of N and P concentrations on the charge properties have also been investigated. A correlation is found between the N/P concentration ratio and the isoelectric point; the absolute measurements confirm the direct correlation with the N content and the inverse correlation with the P content." @default.
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- W1974448095 date "1982-06-01" @default.
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- W1974448095 title "Surface properties of yeast cells: Chemical composition By XPS and isoelectric point" @default.
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- W1974448095 doi "https://doi.org/10.1016/0166-6622(82)80027-9" @default.
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