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• W1974809930 abstract "Abstract TiAlN films were deposited on AISI O1 tool steel using a triode magnetron sputtering system. The bias voltage effect on the composition, thickness, crystallography, microstructure, hardness and adhesion strength was investigated. The coatings thickness and elemental composition analyses were carried out using scanning electron microscopy (SEM) together with energy dispersive X-ray (EDS). The re-sputtering effect due to the high-energy ions bombardment on the film surface influenced the coatings thickness. The films crystallography was investigated using X-ray diffraction characterization. The X-ray diffraction (XRD) data show that TiAlN coatings were crystallized in the cubic NaCl B1 structure, with orientations in the {1 1 1}, {2 0 0} {2 2 0} and {3 1 1} crystallographic planes. The surface morphology (roughness and grain size) of TiAlN coatings was investigated by atomic force microscopy (AFM). By increasing the substrate bias voltage from −40 to −150 V, hardness decreased from 32 GPa to 19 GPa. Scratch tester was used for measuring the critical loads and for measuring the adhesion." @default.
• W1974809930 created "2016-06-24" @default.
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• W1974809930 date "2011-05-01" @default.
• W1974809930 modified "2023-10-16" @default.
• W1974809930 title "TiAlN coatings deposited by triode magnetron sputtering varying the bias voltage" @default.
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• W1974809930 doi "https://doi.org/10.1016/j.apsusc.2011.02.027" @default.
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