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- W1975886255 endingPage "117" @default.
- W1975886255 startingPage "114" @default.
- W1975886255 abstract "Low-duty-cycle pulsed dc switching experiments have been performed on a variety of thin-film Te-based semiconducting glasses. No premonitory effects are observed in the current-time profile of the nonswitching off state. If, however, the threshold voltage is exceeded, a continuous current increase with time throughout the normal delay-time regime (preswitching off state) is always observed prior to switching. In a given device or film this current rise is interrupted, independent of overvoltage, by the rapid switching transition at about the same relative current increment above the current background extrapolated to zero time (leakage current). In the switched or on (filamentary conduction) state the current level, as limited by the series load resistor, can condition the response of the device in the subsequent preswitched off state. For loads in excess of ∼1 kΩ, there is no effect on the preswitching off state characteristics whereas, for appreciably smaller loads, there is a continuous increase in delay time with increased pulse length (time spent in the previous on state). The results (i) indicate that the development of a filamentary instability begins at the onset of the pulse and (ii) show that the operating threshold voltage can be raised (returned to its virgin value) when the operating current is large for a sufficiently long time. These features are consistent with switching models that treat the ``formed'' switching element as a high-conductance-formed filamentary region (of not necessarily uniform composition) surrounded by a low-conductivity glass." @default.
- W1975886255 created "2016-06-24" @default.
- W1975886255 creator A5045377157 @default.
- W1975886255 creator A5050717074 @default.
- W1975886255 creator A5067414682 @default.
- W1975886255 creator A5083544419 @default.
- W1975886255 date "1973-02-01" @default.
- W1975886255 modified "2023-09-25" @default.
- W1975886255 title "Preswitching and postswitching phenomena in amorphous semiconducting films" @default.
- W1975886255 cites W1980947534 @default.
- W1975886255 cites W1981351201 @default.
- W1975886255 cites W1988543490 @default.
- W1975886255 cites W1993367360 @default.
- W1975886255 cites W2046906594 @default.
- W1975886255 cites W2064211403 @default.
- W1975886255 cites W2072262631 @default.
- W1975886255 doi "https://doi.org/10.1063/1.1654571" @default.
- W1975886255 hasPublicationYear "1973" @default.
- W1975886255 type Work @default.
- W1975886255 sameAs 1975886255 @default.
- W1975886255 citedByCount "27" @default.
- W1975886255 countsByYear W19758862552020 @default.
- W1975886255 countsByYear W19758862552022 @default.
- W1975886255 crossrefType "journal-article" @default.
- W1975886255 hasAuthorship W1975886255A5045377157 @default.
- W1975886255 hasAuthorship W1975886255A5050717074 @default.
- W1975886255 hasAuthorship W1975886255A5067414682 @default.
- W1975886255 hasAuthorship W1975886255A5083544419 @default.
- W1975886255 hasConcept C119599485 @default.
- W1975886255 hasConcept C121332964 @default.
- W1975886255 hasConcept C121932024 @default.
- W1975886255 hasConcept C127413603 @default.
- W1975886255 hasConcept C131540310 @default.
- W1975886255 hasConcept C137488568 @default.
- W1975886255 hasConcept C147789679 @default.
- W1975886255 hasConcept C148043351 @default.
- W1975886255 hasConcept C165801399 @default.
- W1975886255 hasConcept C178790620 @default.
- W1975886255 hasConcept C185592680 @default.
- W1975886255 hasConcept C192562407 @default.
- W1975886255 hasConcept C199310435 @default.
- W1975886255 hasConcept C26873012 @default.
- W1975886255 hasConcept C2780147050 @default.
- W1975886255 hasConcept C47586369 @default.
- W1975886255 hasConcept C49040817 @default.
- W1975886255 hasConcept C56052488 @default.
- W1975886255 hasConcept C97355855 @default.
- W1975886255 hasConceptScore W1975886255C119599485 @default.
- W1975886255 hasConceptScore W1975886255C121332964 @default.
- W1975886255 hasConceptScore W1975886255C121932024 @default.
- W1975886255 hasConceptScore W1975886255C127413603 @default.
- W1975886255 hasConceptScore W1975886255C131540310 @default.
- W1975886255 hasConceptScore W1975886255C137488568 @default.
- W1975886255 hasConceptScore W1975886255C147789679 @default.
- W1975886255 hasConceptScore W1975886255C148043351 @default.
- W1975886255 hasConceptScore W1975886255C165801399 @default.
- W1975886255 hasConceptScore W1975886255C178790620 @default.
- W1975886255 hasConceptScore W1975886255C185592680 @default.
- W1975886255 hasConceptScore W1975886255C192562407 @default.
- W1975886255 hasConceptScore W1975886255C199310435 @default.
- W1975886255 hasConceptScore W1975886255C26873012 @default.
- W1975886255 hasConceptScore W1975886255C2780147050 @default.
- W1975886255 hasConceptScore W1975886255C47586369 @default.
- W1975886255 hasConceptScore W1975886255C49040817 @default.
- W1975886255 hasConceptScore W1975886255C56052488 @default.
- W1975886255 hasConceptScore W1975886255C97355855 @default.
- W1975886255 hasIssue "3" @default.
- W1975886255 hasLocation W19758862551 @default.
- W1975886255 hasOpenAccess W1975886255 @default.
- W1975886255 hasPrimaryLocation W19758862551 @default.
- W1975886255 hasRelatedWork W1918360476 @default.
- W1975886255 hasRelatedWork W1998069172 @default.
- W1975886255 hasRelatedWork W2003092206 @default.
- W1975886255 hasRelatedWork W2088836909 @default.
- W1975886255 hasRelatedWork W2145762596 @default.
- W1975886255 hasRelatedWork W2351661674 @default.
- W1975886255 hasRelatedWork W2466369654 @default.
- W1975886255 hasRelatedWork W2911400173 @default.
- W1975886255 hasRelatedWork W2921020074 @default.
- W1975886255 hasRelatedWork W4282980997 @default.
- W1975886255 hasVolume "22" @default.
- W1975886255 isParatext "false" @default.
- W1975886255 isRetracted "false" @default.
- W1975886255 magId "1975886255" @default.
- W1975886255 workType "article" @default.