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• W1977366479 abstract "A comprehensive NBTI framework using the H/H <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>2</sub> RD model for interface traps and 2 well model for hole traps has been proposed and used to predict DC and AC experiments. The framework is validated against experimental data from different DC stress and recovery conditions, AC frequency and duty cycle, measurement speed, and across SiON and HKMG devices having different gate insulator processes. Limitations of the alternative 2 stage model framework is discussed." @default.
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• W1977366479 date "2013-04-01" @default.
• W1977366479 modified "2023-09-23" @default.
• W1977366479 title "A comprehensive AC / DC NBTI model: Stress, recovery, frequency, duty cycle and process dependence" @default.
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• W1977366479 doi "https://doi.org/10.1109/irps.2013.6532117" @default.
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