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- W1977622105 abstract "The generation of test patterns for sequential circuits is one of the most challenging problems arising in the field of Computer-Aided Design for VLSI circuits. In the past decade, Genetic Algorithms have been deeply investigated as a possible approach: several algorithms have been described, and significant improvements have been proposed with respect to their original versions. As a result, GA-based test pattern generators can now effectively compete with other methods, such as topological or symbolic ones. This paper discusses the advantages and disadvantages of GA-based approaches and describes GATTO, a state-of-the-art GA-based test pattern generator. Other algorithms belonging to the same category are outlined as well. The paper puts GATTO and other GA-based tools in perspective, and shows that Evolutionary computation techniques can successfully compete with more traditional approaches, or be integrated with them.© (1998) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only." @default.
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- W1977622105 date "1998-10-13" @default.
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- W1977622105 title "<title>Experiences in the use of evolutionary techniques for testing digital circuits</title>" @default.
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- W1977622105 doi "https://doi.org/10.1117/12.326704" @default.
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