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• W1977690401 endingPage "133" @default.
• W1977690401 startingPage "86" @default.
• W1977690401 abstract "This review covers a wide range of surface analytical techniques: X-ray photoelectron spectroscopy (XPS), scanning photoelectron microscopy (SPEM), photoemission electron microscopy (PEEM), dynamic and static secondary ion mass spectroscopy (SIMS), electron backscatter diffraction (EBSD), atomic force microscopy (AFM). Others that are relatively less widely used but are also important to the Earth Sciences are also included: Auger electron spectroscopy (AES), low energy electron diffraction (LEED) and scanning tunnelling microscopy (STM). All these techniques probe only the very top sample surface layers (sub-nm to several tens of nm). In addition, we also present several other techniques i.e. Raman microspectroscopy, reflection infrared (IR) microspectroscopy and quantitative evaluation of minerals by scanning electron microscopy (QEMSCAN) that penetrate deeper into the sample, up to several μm, as all of them are fundamental analytical tools for the Earth Sciences. Grazing incidence synchrotron techniques, sensitive to surface measurements, are also briefly introduced at the end of this review. (Scanning) transmission electron microscopy (TEM/STEM) is a special case that can be applied to characterisation of mineralogical and geological sample surfaces. Since TEM/STEM is such an important technique for Earth Scientists, we have also included it to draw attention to the capability of TEM/STEM applied as a surface-equivalent tool. While this review presents most of the important techniques for the Earth Sciences, it is not an all-inclusive bibliography of those analytical techniques. Instead, for each technique that is discussed, we first give a very brief introduction about its principle and background, followed by a short section on approaches to sample preparation that are important for researchers to appreciate prior to the actual sample analysis. We then use examples from publications (and also some of our known unpublished results) within the Earth Sciences to show how each technique is applied and used to obtain specific information and to resolve real problems, which forms the central theme of this review. Although this review focuses on applications of these techniques to study mineralogical and geological samples, we also anticipate that researchers from other research areas such as Material and Environmental Sciences may benefit from this review. • A range of surface techniques and their applications in Earth Sciences are reviewed. • Some relatively new techniques, e.g. 3D-SIMS, concurrent EBSD/EDS, are presented. • Other less widely used surface techniques, e.g. LEED, are also included. • Their capabilities are summarised at the end of this review." @default.
• W1977690401 created "2016-06-24" @default.
• W1977690401 creator A5015575928 @default.
• W1977690401 creator A5017249630 @default.
• W1977690401 creator A5046169189 @default.
• W1977690401 date "2015-03-01" @default.
• W1977690401 modified "2023-09-24" @default.
• W1977690401 title "Applications of surface analytical techniques in Earth Sciences" @default.
• W1977690401 cites W1518709338 @default.
• W1977690401 cites W1612362694 @default.
• W1977690401 cites W1643676121 @default.
• W1977690401 cites W1657961768 @default.
• W1977690401 cites W1904159006 @default.
• W1977690401 cites W1963824554 @default.
• W1977690401 cites W1963936841 @default.
• W1977690401 cites W1965045099 @default.
• W1977690401 cites W1966118057 @default.
• W1977690401 cites W1967318028 @default.
• W1977690401 cites W1967809548 @default.
• W1977690401 cites W1967850398 @default.
• W1977690401 cites W1969369412 @default.
• W1977690401 cites W1970160686 @default.
• W1977690401 cites W1970342793 @default.
• W1977690401 cites W1970597651 @default.
• W1977690401 cites W1970608618 @default.
• W1977690401 cites W1971389155 @default.
• W1977690401 cites W1971870089 @default.
• W1977690401 cites W1971904263 @default.
• W1977690401 cites W1972548771 @default.
• W1977690401 cites W1973183922 @default.
• W1977690401 cites W1973452424 @default.
• W1977690401 cites W1974104980 @default.
• W1977690401 cites W1974272876 @default.
• W1977690401 cites W1974480160 @default.
• W1977690401 cites W1975430960 @default.
• W1977690401 cites W1975538654 @default.
• W1977690401 cites W1975652443 @default.
• W1977690401 cites W1976854444 @default.
• W1977690401 cites W1977190227 @default.
• W1977690401 cites W1977433486 @default.
• W1977690401 cites W1978361440 @default.
• W1977690401 cites W1978771740 @default.
• W1977690401 cites W1979177298 @default.
• W1977690401 cites W1979327888 @default.
• W1977690401 cites W1979725474 @default.
• W1977690401 cites W1979757207 @default.
• W1977690401 cites W1981002526 @default.
• W1977690401 cites W1981055513 @default.
• W1977690401 cites W1981061035 @default.
• W1977690401 cites W1981225062 @default.
• W1977690401 cites W1981354692 @default.
• W1977690401 cites W1981552716 @default.
• W1977690401 cites W1983274744 @default.
• W1977690401 cites W1983316441 @default.
• W1977690401 cites W1983345106 @default.
• W1977690401 cites W1983684958 @default.
• W1977690401 cites W1985240449 @default.
• W1977690401 cites W1985880894 @default.
• W1977690401 cites W1986907919 @default.
• W1977690401 cites W1987660920 @default.
• W1977690401 cites W1988158770 @default.
• W1977690401 cites W1988473701 @default.
• W1977690401 cites W1988510032 @default.
• W1977690401 cites W1989182463 @default.
• W1977690401 cites W1989556076 @default.
• W1977690401 cites W1989623316 @default.
• W1977690401 cites W1989716869 @default.
• W1977690401 cites W1990523740 @default.
• W1977690401 cites W1991006321 @default.
• W1977690401 cites W1991027036 @default.
• W1977690401 cites W1991922379 @default.
• W1977690401 cites W1992263854 @default.
• W1977690401 cites W1992751888 @default.
• W1977690401 cites W1992851352 @default.
• W1977690401 cites W1993198144 @default.
• W1977690401 cites W1993208261 @default.
• W1977690401 cites W1993499055 @default.
• W1977690401 cites W1993875391 @default.
• W1977690401 cites W1993994953 @default.
• W1977690401 cites W1994716093 @default.
• W1977690401 cites W1995772204 @default.
• W1977690401 cites W1996316950 @default.
• W1977690401 cites W1996462050 @default.
• W1977690401 cites W1997063629 @default.
• W1977690401 cites W1997106644 @default.
• W1977690401 cites W1997324051 @default.
• W1977690401 cites W1997601414 @default.
• W1977690401 cites W1997873778 @default.
• W1977690401 cites W1998033723 @default.
• W1977690401 cites W1998289734 @default.
• W1977690401 cites W1998402979 @default.
• W1977690401 cites W1998812480 @default.
• W1977690401 cites W1999018703 @default.
• W1977690401 cites W1999438469 @default.
• W1977690401 cites W1999726317 @default.
• W1977690401 cites W2000973865 @default.
• W1977690401 cites W2001683106 @default.
• W1977690401 cites W2003120420 @default.

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