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- W1978125296 abstract "This paper presents fabrication and electrical characterization of barrier type TiO2 metal–insulator–metal (MIM) capacitor using anodization. Polarization process, conduction mechanisms, and structural properties are studied in detail. We found that the anodization voltage played a major role in electrical and structural properties of the thin film. The barrier type anodic TiO2 is suggested as a dielectric material for high-performance MIM capacitors." @default.
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- W1978125296 date "2013-04-01" @default.
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- W1978125296 title "Nanostructured metal–insulator–metal capacitor with anodic titania" @default.
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- W1978125296 doi "https://doi.org/10.1016/j.mssp.2012.10.013" @default.
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