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• W1978163042 endingPage "6357" @default.
• W1978163042 startingPage "6353" @default.
• W1978163042 abstract "The presence of high electric fields at the drain junction in polycrystalline silicon (polysilicon) thin film transistors (TFTs), enhances several undesired effects, such as hot-carrier related instabilities and kink effect. In order to reduce the drain electric field, non-self-aligned (NSA) device architecture can be adopted. In this case, dopant activation and active layer crystallization are achieved at the same time by excimer laser annealing, resulting in a substantial lateral dopant diffusion . The gradual doping profile provides not only a reduction of the drain electric field, but also a channel length shortening. Therefore, an effective channel length ( L eff ) has to be determined in such devices, in order to successfully design circuit applications. In this work, L eff and parasitic resistance ( R p ) modulation effects have been investigated in both n- and p-channel NSA polysilicon TFTs. Three different parameter extraction methods, originally proposed for the crystalline MOSFETs technology, have been used and compared in order to extract L eff and R p , including: the “channel resistance” method; the “paired V g ” method; the “shift and ratio” method. These methods indicate a channel length reduction up to 1 μm and a non negligible parasitic resistance effect. The reliability of the results of the three methods are discussed in terms of applicability of the underlying assumptions in the case of polysilicon TFTs and numerical simulations are used to support the analysis." @default.
• W1978163042 created "2016-06-24" @default.
• W1978163042 creator A5002798375 @default.
• W1978163042 creator A5017503952 @default.
• W1978163042 creator A5017950678 @default.
• W1978163042 creator A5021002400 @default.
• W1978163042 creator A5038324618 @default.
• W1978163042 creator A5058987996 @default.
• W1978163042 creator A5075915059 @default.
• W1978163042 creator A5083035565 @default.
• W1978163042 creator A5084476034 @default.
• W1978163042 date "2009-10-01" @default.
• W1978163042 modified "2023-10-18" @default.
• W1978163042 title "Effective channel length and parasitic resistance determination in non self-aligned low temperature polycrystalline silicon thin film transistors" @default.
• W1978163042 cites W1963914391 @default.
• W1978163042 cites W1968236284 @default.
• W1978163042 cites W1968807778 @default.
• W1978163042 cites W1973339006 @default.
• W1978163042 cites W2000673128 @default.
• W1978163042 cites W2018322904 @default.
• W1978163042 cites W2021788585 @default.
• W1978163042 cites W2028756086 @default.
• W1978163042 cites W2037070798 @default.
• W1978163042 cites W2042076254 @default.
• W1978163042 cites W2044647412 @default.
• W1978163042 cites W2053006767 @default.
• W1978163042 cites W2055138041 @default.
• W1978163042 cites W2068488703 @default.
• W1978163042 cites W2070844778 @default.
• W1978163042 cites W2072298802 @default.
• W1978163042 cites W2104729395 @default.
• W1978163042 cites W2106433385 @default.
• W1978163042 cites W2112471571 @default.
• W1978163042 cites W2126986042 @default.
• W1978163042 cites W2163799983 @default.
• W1978163042 doi "https://doi.org/10.1016/j.tsf.2009.02.067" @default.
• W1978163042 hasPublicationYear "2009" @default.
• W1978163042 type Work @default.
• W1978163042 sameAs 1978163042 @default.
• W1978163042 citedByCount "8" @default.
• W1978163042 countsByYear W19781630422012 @default.
• W1978163042 countsByYear W19781630422013 @default.
• W1978163042 countsByYear W19781630422018 @default.
• W1978163042 countsByYear W19781630422021 @default.
• W1978163042 crossrefType "journal-article" @default.
• W1978163042 hasAuthorship W1978163042A5002798375 @default.
• W1978163042 hasAuthorship W1978163042A5017503952 @default.
• W1978163042 hasAuthorship W1978163042A5017950678 @default.
• W1978163042 hasAuthorship W1978163042A5021002400 @default.
• W1978163042 hasAuthorship W1978163042A5038324618 @default.
• W1978163042 hasAuthorship W1978163042A5058987996 @default.
• W1978163042 hasAuthorship W1978163042A5075915059 @default.
• W1978163042 hasAuthorship W1978163042A5083035565 @default.
• W1978163042 hasAuthorship W1978163042A5084476034 @default.
• W1978163042 hasConcept C119599485 @default.
• W1978163042 hasConcept C121332964 @default.
• W1978163042 hasConcept C127413603 @default.
• W1978163042 hasConcept C159985019 @default.
• W1978163042 hasConcept C165801399 @default.
• W1978163042 hasConcept C171250308 @default.
• W1978163042 hasConcept C172385210 @default.
• W1978163042 hasConcept C191952053 @default.
• W1978163042 hasConcept C192562407 @default.
• W1978163042 hasConcept C195370968 @default.
• W1978163042 hasConcept C2777855556 @default.
• W1978163042 hasConcept C2779227376 @default.
• W1978163042 hasConcept C2780081452 @default.
• W1978163042 hasConcept C2780565262 @default.
• W1978163042 hasConcept C49040817 @default.
• W1978163042 hasConcept C544956773 @default.
• W1978163042 hasConcept C57863236 @default.
• W1978163042 hasConcept C60799052 @default.
• W1978163042 hasConcept C62520636 @default.
• W1978163042 hasConcept C71367568 @default.
• W1978163042 hasConcept C87359718 @default.
• W1978163042 hasConceptScore W1978163042C119599485 @default.
• W1978163042 hasConceptScore W1978163042C121332964 @default.
• W1978163042 hasConceptScore W1978163042C127413603 @default.
• W1978163042 hasConceptScore W1978163042C159985019 @default.
• W1978163042 hasConceptScore W1978163042C165801399 @default.
• W1978163042 hasConceptScore W1978163042C171250308 @default.
• W1978163042 hasConceptScore W1978163042C172385210 @default.
• W1978163042 hasConceptScore W1978163042C191952053 @default.
• W1978163042 hasConceptScore W1978163042C192562407 @default.
• W1978163042 hasConceptScore W1978163042C195370968 @default.
• W1978163042 hasConceptScore W1978163042C2777855556 @default.
• W1978163042 hasConceptScore W1978163042C2779227376 @default.
• W1978163042 hasConceptScore W1978163042C2780081452 @default.
• W1978163042 hasConceptScore W1978163042C2780565262 @default.
• W1978163042 hasConceptScore W1978163042C49040817 @default.
• W1978163042 hasConceptScore W1978163042C544956773 @default.
• W1978163042 hasConceptScore W1978163042C57863236 @default.
• W1978163042 hasConceptScore W1978163042C60799052 @default.
• W1978163042 hasConceptScore W1978163042C62520636 @default.
• W1978163042 hasConceptScore W1978163042C71367568 @default.
• W1978163042 hasConceptScore W1978163042C87359718 @default.
• W1978163042 hasIssue "23" @default.
• W1978163042 hasLocation W19781630421 @default.

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