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• W1978495322 abstract "Abstract Epitaxial CdTe:In films of the thickness down to 0.1 μm were grown and doped by MBE. The carrier concentration was controlled in the range from 8 × 1014 to 2 × 1018 cm−3 by varying the In flux. Free standing, conducting wires with the linewidth down to 0.3 μm were fabricated by means of electron-beam lithography followed by wet etching, and visualized by means of scanning-electron and atomic-force microscopies. Magnetoresistance measurements of the films and wires were carried out at temperatures down to 60 mK. A comparison of the data with theoretical predictions for the magnetoconductance in the weakly localized regime demonstrated the presence of temperature-induced dimensional crossovers in the studied structures. The electron phase-coherence length was determined for 1, 2, and 3 dimensional systems and showed to be limited by electron-electron interactions." @default.
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• W1978495322 date "1997-09-01" @default.
• W1978495322 modified "2023-10-03" @default.
• W1978495322 title "Fabrication and magnetoconductance studies on submicron wires and films of MBE grown CdTe:In" @default.
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• W1978495322 doi "https://doi.org/10.1016/s0040-6090(97)00285-x" @default.
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