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- W1978647712 abstract "In this paper, we propose new techniques for detecting and quantifying print defects. In our previous work, weintroduced a scanner-based print quality system to characterize directional print defects, such as banding, jitter,and streaking. We extend our previous print quality work two ways. First, we introduce techniques for detecting2-D isotropic, mottled print defects such as grain and mottle. Wavelet pre-filtering is used to limit the defect'ssize or frequency range. Then we analyze the L* variation in the wavelet-processed images. The methods usedto quantify grain and mottle are similar to ISO/IEC 13660 techniques. The second part of this paper providestechniques for detecting and quantifying low frequency directional defects, which we call left-to-right and top-to-bottom L* variation. Since these defects extend less than two cycles across the page, and probably less thana complete cycle, we fit a 4th-degree polynomial to the defect profile. To measure the strength of the defect,we use variational analysis of the fitted polynomial. Experimental results on 10 printers and 100 print samplesshowed an average correlation for isotropic defects of 0.85 between the proposed measures and experts' visualevaluation, and 0.97 for low frequency defects." @default.
- W1978647712 created "2016-06-24" @default.
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- W1978647712 date "2008-01-27" @default.
- W1978647712 modified "2023-09-23" @default.
- W1978647712 title "Characterization of mottle and low-frequency print defects" @default.
- W1978647712 doi "https://doi.org/10.1117/12.766785" @default.
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