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• W1978721868 abstract "In this article we report theoretical as well as experimental studies of the electric-field-induced refractive index change in InGaAs/InP quantum-well structures, viz., quantum-film, quantum-wire, and quantum-box structures. The refractive index change, easily measured using a Mach-Zehnder interferometer setup, was around 1%, 4%, and 7% in quantum film, quantum wire, and quantum box, respectively, in the longer-wavelength region corresponding to the positive refractive index change peak. Moreover, we will discuss that the refractive index change dependency on the polarization of incident light in a quantum film can be controlled by introducing suitable tensile strain in it. It was found that for a well width of 11 nm, 0.3% tensile strain should be induced to obtain polarization-independent refractive index change. © 1994 John Wiley & Sons, Inc." @default.
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• W1978721868 date "1994-02-20" @default.
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• W1978721868 title "Theoretical and experimental studies of electric-field-induced refractive index change in quantum-film, -wire, and -box structures" @default.
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• W1978721868 doi "https://doi.org/10.1002/mop.4650070305" @default.
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