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• W1978768417 endingPage "3337" @default.
• W1978768417 startingPage "3333" @default.
• W1978768417 abstract "Commercial VDMOSFETs transistors were subjected to positive and negative high field stress. A new model of current deep level transient spectroscopy (CDLTS) characterization is adopted in a research of defects induced and activated by electrical stress. This model is based on pulse width scan instead of classical temperature scan. The band gap is scanned by varying the pulse base level. Positive and negative high field stresses were applied for different periods ranging from 30 to 120 min. After each stress period, activation energies and capture cross sections of detected traps were estimated. Different defects were detected and we have distinguished the doping levels and interface states from deep levels located in the forbidden band gap." @default.
• W1978768417 created "2016-06-24" @default.
• W1978768417 creator A5024816713 @default.
• W1978768417 creator A5025166626 @default.
• W1978768417 creator A5045497245 @default.
• W1978768417 creator A5067006319 @default.
• W1978768417 date "2011-11-01" @default.
• W1978768417 modified "2023-10-12" @default.
• W1978768417 title "Detection of traps induced and activated by high field stress in an N-channel VDMOSFET transistor using current deep level transient spectroscopy (CDLTS)" @default.
• W1978768417 cites W1972813670 @default.
• W1978768417 cites W1982184900 @default.
• W1978768417 cites W1983840242 @default.
• W1978768417 cites W1985438300 @default.
• W1978768417 cites W1991206968 @default.
• W1978768417 cites W2003466081 @default.
• W1978768417 cites W2010997767 @default.
• W1978768417 cites W2041081082 @default.
• W1978768417 cites W2041932149 @default.
• W1978768417 cites W2059944796 @default.
• W1978768417 cites W2063765143 @default.
• W1978768417 cites W2065957777 @default.
• W1978768417 cites W2066133227 @default.
• W1978768417 cites W2077454557 @default.
• W1978768417 cites W2077647496 @default.
• W1978768417 cites W2083656921 @default.
• W1978768417 cites W2085280280 @default.
• W1978768417 cites W2091234723 @default.
• W1978768417 cites W2092665187 @default.
• W1978768417 cites W2093825288 @default.
• W1978768417 cites W2113863023 @default.
• W1978768417 cites W3152039277 @default.
• W1978768417 cites W574197631 @default.
• W1978768417 cites W594149538 @default.
• W1978768417 doi "https://doi.org/10.1016/j.mee.2011.08.008" @default.
• W1978768417 hasPublicationYear "2011" @default.
• W1978768417 type Work @default.
• W1978768417 sameAs 1978768417 @default.
• W1978768417 citedByCount "1" @default.
• W1978768417 countsByYear W19787684172017 @default.
• W1978768417 crossrefType "journal-article" @default.
• W1978768417 hasAuthorship W1978768417A5024816713 @default.
• W1978768417 hasAuthorship W1978768417A5025166626 @default.
• W1978768417 hasAuthorship W1978768417A5045497245 @default.
• W1978768417 hasAuthorship W1978768417A5067006319 @default.
• W1978768417 hasConcept C111919701 @default.
• W1978768417 hasConcept C113196181 @default.
• W1978768417 hasConcept C119599485 @default.
• W1978768417 hasConcept C120665830 @default.
• W1978768417 hasConcept C121332964 @default.
• W1978768417 hasConcept C127413603 @default.
• W1978768417 hasConcept C138885662 @default.
• W1978768417 hasConcept C145598152 @default.
• W1978768417 hasConcept C148043351 @default.
• W1978768417 hasConcept C165801399 @default.
• W1978768417 hasConcept C171250308 @default.
• W1978768417 hasConcept C172385210 @default.
• W1978768417 hasConcept C181966813 @default.
• W1978768417 hasConcept C184779094 @default.
• W1978768417 hasConcept C185592680 @default.
• W1978768417 hasConcept C192562407 @default.
• W1978768417 hasConcept C202444582 @default.
• W1978768417 hasConcept C21036866 @default.
• W1978768417 hasConcept C2780080961 @default.
• W1978768417 hasConcept C2780167933 @default.
• W1978768417 hasConcept C2780799671 @default.
• W1978768417 hasConcept C2780841128 @default.
• W1978768417 hasConcept C32891209 @default.
• W1978768417 hasConcept C33923547 @default.
• W1978768417 hasConcept C41008148 @default.
• W1978768417 hasConcept C41895202 @default.
• W1978768417 hasConcept C41999313 @default.
• W1978768417 hasConcept C43617362 @default.
• W1978768417 hasConcept C49040817 @default.
• W1978768417 hasConcept C544956773 @default.
• W1978768417 hasConcept C57863236 @default.
• W1978768417 hasConcept C62520636 @default.
• W1978768417 hasConcept C94915269 @default.
• W1978768417 hasConcept C9652623 @default.
• W1978768417 hasConceptScore W1978768417C111919701 @default.
• W1978768417 hasConceptScore W1978768417C113196181 @default.
• W1978768417 hasConceptScore W1978768417C119599485 @default.
• W1978768417 hasConceptScore W1978768417C120665830 @default.
• W1978768417 hasConceptScore W1978768417C121332964 @default.
• W1978768417 hasConceptScore W1978768417C127413603 @default.
• W1978768417 hasConceptScore W1978768417C138885662 @default.
• W1978768417 hasConceptScore W1978768417C145598152 @default.
• W1978768417 hasConceptScore W1978768417C148043351 @default.
• W1978768417 hasConceptScore W1978768417C165801399 @default.
• W1978768417 hasConceptScore W1978768417C171250308 @default.
• W1978768417 hasConceptScore W1978768417C172385210 @default.
• W1978768417 hasConceptScore W1978768417C181966813 @default.
• W1978768417 hasConceptScore W1978768417C184779094 @default.
• W1978768417 hasConceptScore W1978768417C185592680 @default.
• W1978768417 hasConceptScore W1978768417C192562407 @default.
• W1978768417 hasConceptScore W1978768417C202444582 @default.
• W1978768417 hasConceptScore W1978768417C21036866 @default.
• W1978768417 hasConceptScore W1978768417C2780080961 @default.
• W1978768417 hasConceptScore W1978768417C2780167933 @default.

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