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- W1978797445 abstract "A miniaturized electronic speckle pattern interferometry system (ESPI) has been developed for in situ measurements of microdeformations on buildings and monuments. Direct coupling between object and the compact optical head of the system enabled detection of microdisplacements even in non laboratory environments. Several examples of applications in deterioration investigations are presented." @default.
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- W1978797445 date "1990-04-25" @default.
- W1978797445 modified "2023-10-03" @default.
- W1978797445 title "In Situ Application Of Electronic Speckle Pattern Interferometry (ESPI) In The Investigation Of Stone Decay" @default.
- W1978797445 doi "https://doi.org/10.1117/12.962743" @default.
- W1978797445 hasPublicationYear "1990" @default.
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