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• W1978809482 abstract "Silicon carbide (SiC) is a wide bandgap material with many excellent properties for future use as a detector medium. We present here the performance of irradiated planar detector diodes made from 100-μm-thick semi-insulating SiC from Cree. Ohmic/Schottky diodes were produced and characterised using Schottky barrier measurements and charge collection efficiency (CCE) measurements were made for 5.48 MeV 241 Am alpha particles . Charge collection of ∼60% was measured initially. Measurements were taken of trap lifetimes in an effort to understand this. Three distinct traps with lifetimes of 4, 16, and 130 s were found. Irradiation took place at Paul Scherrer Institute (PSI) to fluences of 10 12 , 10 13 , and 5×10 14 cm −2 , with 300 MeV /c pions . Changes in the Schottky barrier height , leakage current, trap lifetimes, and CCE measurements give an indication of the possible degradation in performance of detectors of this type over their projected lifetime." @default.
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• W1978809482 date "2003-08-01" @default.
• W1978809482 modified "2023-09-29" @default.
• W1978809482 title "Performance of irradiated bulk SiC detectors" @default.
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• W1978809482 doi "https://doi.org/10.1016/s0168-9002(03)01560-2" @default.
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