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- W1979524211 abstract "Abstract This paper describes a new ultrahigh-vacuum scanning tunneling microscope (UHV-STM) which allows atomic-level observation as a function of temperature. It also reports on the use of this instrument for some high-temperature (HT) and low-temperature (LT) studies of semiconductor surfaces including various surface changes of the Si(111), Si(110) and Si(100) surfaces to new reconstructed structures at high temperatures, various surface behaviors, ultra-micro-processing; adsorption of different atom species and growth processes and low-temperature buckling structures of Si(100) dimer rows during ultra-low temperature observation." @default.
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- W1979524211 date "1996-02-01" @default.
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- W1979524211 title "High-temperature STM for atomic processes on semiconductor surfaces" @default.
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- W1979524211 doi "https://doi.org/10.1016/0169-4332(95)00249-9" @default.
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