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- W1979789494 abstract "Abstract An analysis is given of the determination of bulk diffusion lengths in semiconductors from the induced current profiles that are obtained by scanning an electron beam with normal incidence on a Schottky diode. The discussion assumes that the carrier recombination velocity at the free semiconductor surface is vs = 0. In this case the mixed boundary conditions of the diffusion problem for excess minority carriers can be converted into normal ones by using polar coordinates, and an explicit expression for the induced current profile can be given. This expression is compared to that already known for the opposite case vs = ∞, to establish the influence of the surface recombination velocity on a number of profile properties, such as symmetry, asymptotic decay, or low-order moments of the derivative. It is shown that by evaluating the variance of the profile derivative at two beam energies the diffusion length can be determined independently of the knowledge of the value of vs." @default.
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- W1979789494 date "1985-11-01" @default.
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- W1979789494 title "Charge collection in a Schottky diode as a mixed boundary-value problem" @default.
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- W1979789494 doi "https://doi.org/10.1016/0038-1101(85)90195-9" @default.
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