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- W1980005364 abstract "For scanning hot electron microscopy experiments, n-Si/CaF 2 /Au hot electron emitters were designed and fabricated to characterize the emission properties. A self-consistent method was used in analyzing the hot electron energy and the tunneling current density while considering the quantum mechanical effects in the space-charge region. By comparison of the theoretical calculations with the experimental results for current density, the tunneling electron effective mass of CaF 2 is estimated to be about 0.3 m 0 . This material structure can provide an electron current density of more than 10 A/cm 2 at the hot electron energies of 2.9 eV or 3.7 eV by selecting the thickness of CaF 2 to be 3 nm or 4 nm, respectively, for the electron density of 8×10 19 cm -3 , or at 3.2 eV or 3.4 eV by selecting the electron density of 10 19 cm -3 or 2×10 18 cm -3 , respectively, for the insulator thickness of 3 nm." @default.
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- W1980005364 date "1999-08-01" @default.
- W1980005364 modified "2023-09-26" @default.
- W1980005364 title "Design and Experimental Characteristics of n-Si/CaF<sub>2</sub>/Au Hot Electron Emitter for Use in Scanning Hot Electron Microscopy" @default.
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- W1980005364 doi "https://doi.org/10.1143/jjap.38.4887" @default.
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