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Matches in SemOpenAlex for { <https://semopenalex.org/work/W1980418266> ?p ?o ?g. }

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• W1980418266 abstract "Abstract The irradiation effects of thinning a sample of a Cu‐Zn‐Al shape memory alloy to electron transparency by a Ga + focused ion beam were investigated. This thinning method was compared with conventional electropolishing and Ar + ion milling. No implanted Ga was detected but surface FCC precipitation was found as a result of the focused ion beam sample preparation. Decreasing the irradiation dose by lowering the energy and current of the Ga + ions did not lead to a complete disappearance of the FCC structure. The latter could only be removed after gentle Ar + ion milling of the sample. It was further concluded that the precipitation of the FCC is independent of the crystallographic orientation of the surface. Microsc. Res. Tech. 74:84‐91, 2011. © 2010 Wiley‐Liss, Inc." @default.
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• W1980418266 date "2010-12-22" @default.
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• W1980418266 title "Reducing the formation of FIB-induced FCC layers on Cu-Zn-Al austenite" @default.
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• W1980418266 doi "https://doi.org/10.1002/jemt.20877" @default.
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