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- W1980567908 endingPage "04EB04" @default.
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- W1980567908 abstract "In this paper, we report the development of reliable fine-pitch micro bump interconnections that used a high-precision room-temperature bonding approach. The accuracy of the bonding process is improved by modifying conventional bump/planar-bonding-pad interconnections to form self-aligned micro bumps/truncated inverted pyramid (TIP) bonding pads, i.e., misalignment self-correction elements (MSCEs). Thermosonic flip-chip bonding (FCB) is utilized to form reliable bonds between these MSCEs at acceptable low temperatures. By applying the proposed bonding approach, the demonstration of fine-pitch Cu bump to Au bonding pad interconnects chip stacking has been realized. Microstructure analyses reveal that 15-µm-pitch micro bump joints are fabricated at room temperature." @default.
- W1980567908 created "2016-06-24" @default.
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- W1980567908 date "2014-03-17" @default.
- W1980567908 modified "2023-09-25" @default.
- W1980567908 title "15-µm-pitch Cu/Au interconnections relied on self-aligned low-temperature thermosonic flip-chip bonding technique for advanced chip stacking applications" @default.
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- W1980567908 doi "https://doi.org/10.7567/jjap.53.04eb04" @default.
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